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TL507C bảng dữ liệu(PDF) 4 Page - Texas Instruments

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TL507C bảng dữ liệu(HTML) 4 Page - Texas Instruments

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TL507C, TL507l
ANALOG-TO-DIGITAL CONVERTER
SLAS041 – OCTOBER 1979 – REVISED OCTOBER 1988
4
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
output section
PARAMETER
TEST CONDITIONS
MIN
TYP†
MAX
UNIT
IOH
High-level output current
VOH = 18 V
0.1
100
µA
IOL
Low-level output current
VOL = 5.5 V
5
10
15
mA
VOL
Low-level output voltage
IOL = 1.6 mA
80
400
mV
operating characteristics over recommended operating free-air temperature range,
VCC1 = VCC2 = 5.12 V
PARAMETER
TEST CONDITIONS
MIN
TYP†
MAX
UNIT
Overall error
±80
mV
Differential nonlinearity
See Figure 1
±20
mV
Zero error‡
Binary count = 0
±80
mV
Scale error
Binary count =127
±80
mV
Full scale input voltage‡
Binary count = 127
3.74
3.82
3.9
V
Propagation delay time from RESET or ENABLE
2
µs
† All typical values are at TA = 25°C.
‡ These parameters are linear functions of VCC1.
definitions
zero error
The absolute value of the difference between the actual analog voltage at the 01H-to-00H transition and the
ideal analog voltage at that transition.
overall error
The magnitude of the deviation from a straight line between the endpoints of the transfer function.
differential nonlinearity
The maximum deviation of an analog-value change associated with a 1-bit code change (1 clock pulse) from
its theoretical value of 1 LSB.



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