LM2724A

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SNVS242C – JUNE 2003 – REVISED MARCH 2013

ABSOLUTE MAXIMUM RATINGS

(1) (2)

VALUE / UNITS

VCC

7V

BOOT to SW

7V

BOOT to GND(3)

35V

SW to GND(4)

-2V to 30V

Junction Temperature

+150°C

720mW (SOIC-8)

Power Dissipation(5)

3.2W (WSON-8)

Storage Temperature

−65°C to 150°C

ESD Susceptibility

Human Body Model(6)

2.0 kV

Soldering Time, Temperature

10sec., 300°C

(1)

Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating ratings are conditions under which

the device operates correctly. The ensured specifications apply only for the listed test conditions. Some performance characteristics may

degrade when the part is not operated under listed conditions.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/Distributors for availability and

specifications.

(3)

If BOOT voltage exceeds this value, the ESD structure will degrade.

(4)

The SW pin can have -2V to -0.5V applied for a maximum duty cycle of 10% with a maximum period of 1 second. There is no duty cycle

or maximum period limitation for a SW pin voltage range of -0.5V to 30V.

(5)

Maximum allowable power dissipation is a function of the maximum junction temperature, TJMAX, the junction-to-ambient thermal

resistance,

θJA, and the ambient temperature, TA. The maximum allowable power dissipation at any ambient temperature is calculated

using: PMAX = (TJMAX-TA) / θJA. The junction-to-ambient thermal resistance, θJA, for LM2724A is 172°C/W. For a TJMAX of 150°C and TA

of 25°C, the maximum allowable power dissipation is 0.7W. The

θJA, for LM2724A WSON package is 39°C/W. For a TJMAX of 150°C

and TA of 25°C, the maximum allowable power dissipation is 3.2W.

(6)

ESD machine model susceptibility is 200V.

RECOMMENDED OPERATING CONDITIONS

(1)

VALUE / UNITS

VCC

4.3V to 6.8V

Junction Temperature Range

-40°C to 125°C

(1)

Absolute Maximum Ratings are limits beyond which damage to the device may occur. Operating ratings are conditions under which

the device operates correctly. The ensured specifications apply only for the listed test conditions. Some performance characteristics may

degrade when the part is not operated under listed conditions.

Copyright © 2003–2013, Texas Instruments Incorporated

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