TDA7415CB datasheet(46/50 Pages) STMICROELECTRONICS

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Programming

TDA7415CB

46/50

Successfully entering the test-mode requires to set bit D6 of the sub address (test mode-bit)

to "1". In test-mode, the TUNER L&R inputs are reconfigured as output for the selected test

signals

Note:

This byte is used for testing and/or evaluation purposes only and must not be set to other

values than the default "11111110" in the application.

Table 31.

Testing * (addr. 31)

MSB

LSB

FUNCTION

Device clock

Enable internal clock generation

Allow external clocking in fast-mode

Unused, do not alter

Test selector

TUNER L out:

DCDet., lower TC-Vth

Spec.Anal. 60Hz-bandpass

Spec.Anal. 160Hz-bandpass

Spec.Anal. 400Hz-bandpass

Spec.Anal. 1kHz-bandpass

Spec.Anal. 2,5kHz-bandpass

Spec.Anal. 6,3kHz-bandpass

Spec.Anal. 16kHz-bandpass

TUNER R out:

DCDet., upper TC-Vth

5,5V CMOS-supply

DCDet., time constant

200kHz reference clock

actual Soft-Mute clock

actual Soft-Step clock

SC-reference, left chan.

DC-Offset monitor point

Test mode

Enabled *

Disabled

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