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TC74AC00FN bảng dữ liệu(PDF) 3 Page - Toshiba Semiconductor

tên linh kiện TC74AC00FN
Giải thích chi tiết về linh kiện  CMOS Digital Integrated Circuit Silicon Monolithic Quad 2-Input NAND Gate
PDF  9 Pages
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nhà sản xuất  TOSHIBA [Toshiba Semiconductor]
Trang chủ  http://www.semicon.toshiba.co.jp/eng
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TC74AC00FN bảng dữ liệu(HTML) 3 Page - Toshiba Semiconductor

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TC74AC00P/F/FN/FT
2007-10-01
3
Operating Ranges (Note)
Characteristics
Symbol
Rating
Unit
Supply voltage
VCC
2.0 to 5.5
V
Input voltage
VIN
0 to VCC
V
Output voltage
VOUT
0 to VCC
V
Operating temperature
Topr
−40 to 85
°C
Input rise and fall time
dt/dV
0 to 100 (VCC = 3.3 ± 0.3 V)
0 to 20 (VCC = 5 ± 0.5 V)
ns/V
Note:
The operating ranges must be maintained to ensure the normal operation of the device.
Unused inputs must be tied to either VCC or GND.
Electrical Characteristics
DC Characteristics
Test Condition
Ta = 25°C
Ta =
−40 to 85°C
Characteristics
Symbol
VCC
(V)
Min
Typ.
Max
Min
Max
Unit
High-level input
voltage
VIH
2.0
3.0
5.5
1.50
2.10
3.85
1.50
2.10
3.85
V
Low-level input
voltage
VIL
2.0
3.0
5.5
0.50
0.90
1.65
0.50
0.90
1.65
V
IOH = −50 μA
2.0
3.0
4.5
1.9
2.9
4.4
2.0
3.0
4.5
1.9
2.9
4.4
High-level output
voltage
VOH
VIN
= VIH or
VIL
IOH = −4 mA
IOH = −24 mA
IOH = −75 mA (Note)
3.0
4.5
5.5
2.58
3.94
2.48
3.80
3.85
V
IOL = 50 μA
2.0
3.0
4.5
0.0
0.0
0.0
0.1
0.1
0.1
0.1
0.1
0.1
Low-level output
voltage
VOL
VIN
= VIH
IOL = 12 mA
IOL = 24 mA
IOL = 75 mA
(Note)
3.0
4.5
5.5
0.36
0.36
0.44
0.44
1.65
V
Input leakage
current
IIN
VIN = VCC or GND
5.5
±0.1
±1.0
μA
Quiescent supply
current
ICC
VIN = VCC or GND
5.5
4.0
40.0
μA
Note:
This spec indicates the capability of driving 50 Ω transmission lines.
One output should be tested at a time for a 10 ms maximum duration.



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