IR211(4,41)/IR221(4,41)SSPbF

www.irf.com

21

Figures 25-83 provide information on the experimental performance of the IR211(4,41)/ IR221(4,41)SSPbF HVIC. The

line plotted in each figure is generated from actual lab data. A large number of individual samples from multiple wafer lots

were tested at three temperatures (-40 ºC, 25 ºC, and 125 ºC) in order to generate the experimental (Exp.) curve. The

line labeled Exp. consist of three data points (one data point at each of the tested temperatures) that have been

connected together to illustrate the understood trend. The individual data points on the curve were determined by

calculating the averaged experimental value of the parameter (for a given temperature).

9.95

10.00

10.05

10.10

10.15

10.20

10.25

10.30

-50

-25

0

25

50

75

100

125

Exp.

0

100

200

300

400

500

600

-50

-25

0

25

50

75

100

125

Exp.

0.00

0.10

0.20

0.30

0.40

0.50

0.60

0.70

0.80

0.90

1.00

-50

-25

0

25

50

75

100

125

Exp.

10.00

10.05

10.10

10.15

10.20

10.25

10.30

10.35

10.40

10.45

-50

-25

0

25

50

75

100

125

Exp.

9.25

9.30

9.35

9.40

9.45

9.50

9.55

9.60

9.65

9.70

-50

-25

0

25

50

75

100

125

Exp.

9.15

9.20

9.25

9.30

9.35

9.40

9.45

9.50

9.55

9.60

-50

-25

0

25

50

75

100

125

Exp.