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CMOS High Voltage Logic – CD4049B

Rev 1.0

21/11/17

PARAMETER

SYMBOL

MIN

MAX

UNITS

Supply Voltage

VDD

3.0

18

V

DC Input Voltage

4

VIN

0

VDD

V

Operating Temperature Range

TJ

-55

+125

°C

Recommended Operating Conditions3 (Voltages referenced to V

SS)

Absolute Maximum Ratings1

PARAMETER

SYMBOL

VALUE

UNIT

DC Supply Voltage (Referenced to VSS)

VDD

-0.5 to +20

V

DC Input Voltage

2 (Referenced to V

SS)

VIN

VDD to +18

V

DC Output Voltage (Referenced to VSS)

VOUT

-0.5 to VDD +0.5

V

Storage Temperature Range

TSTG

-65 to 150

°C

Input Current (per Pad)

IIN, IOUT

±10

mA

Power Dissipation in Still Air

2

PD

750

mW

DC Electrical Characteristics (Voltages referenced to V

SS)

LIMITS

PARAMETER

SYMBOL

VDD

CONDITIONS

25°C

85°C

FULL RANGE

5

UNITS

5V

VOUT = 0.5V

4

4

4

10V

VOUT = 1.0V

8

8

8

Minimum High-Level

Input Voltage

VIH

15V

VOUT = 1.5V

12.5

12.5

12.5

V

5V

VOUT = VDD -0.5V

1

1

1

10V

VOUT = VDD -1.0V

2

2

2

Maximum Low-Level

Input Voltage

VIL

15V

VOUT = VDD -1.5V

2.5

2.5

2.5

V

5V

4.95

4.95

4.95

10V

9.95

9.95

9.95

Minimum High-Level

Output Voltage

VOH

15V

VIN = VSS

14.95

14.95

14.95

V

5V

0.05

0.05

0.05

10V

0.05

0.05

0.05

Maximum Low-Level

Output Voltage

VOL

15V

VIN = VDD

0.05

0.05

0.05

V

Maximum Input

Leakage Current

IIN

18V

VIN = VDD or VSS

±0.1

±.0.1

±1.0

µA

5V

1

1

30

10V

2

2

60

15V

4

4

120

Maximum Quiescent

Supply Leakage

Current

IDD

20V

VIN = VDD or VSS

IOUT = 0µA

20

20

600

µA

3.  This device contains protection circuitry to protect the inputs against damage due to high static voltages or electric fields referenced to the VSS pad

only. Extra precautions must be taken to avoid applications of any voltage higher than the maximum rated voltages to this high−impedance circuit. For

proper operation, the ranges VSS ≤ VIN ≤ 18 V and VSS ≤ VOUT ≤ VDD are recommended. Unused inputs must always be tied to an appropriate logic

voltage level (e.g., either VSS or VDD). Unused outputs must be left open. 4. VIN ≤ VDD is not recommended. High-to-Low level conversion only.

1.  Operation above the absolute maximum rating may cause device failure. Operation at the absolute maximum ratings, for extended periods, may

reduce device reliability. 2. Measured in plastic DIP package, results in die form are dependent on die attach and assembly method.