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LRI2K bảng dữ liệu(PDF) 76 Page - STMicroelectronics |
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LRI2K bảng dữ liệu(HTML) 76 Page - STMicroelectronics |
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76 / 89 page ![]() Maximum rating LRI2K 76/89 21 Maximum rating Stressing the device above the rating listed in the Absolute Maximum Ratings table may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. Table 88. Absolute maximum ratings Symbol Parameter Min. Max. Unit TSTG, hSTG, tSTG Storage conditions Wafer 15 25 °C 23 months kept in its antistatic bag A1, A6, A7 15 25 °C 40% 60% RH 2years ICC Supply current on AC0 / AC1 –20 20 mA VMAX Input voltage on AC0 / AC1 –7 7 V VESD Electrostatic Discharge Voltage(1) (2) 1. Mil. Std. 883 - Method 3015. 2. ESD test: ISO10373-7 specification. A1, A6, A7 –7000 7000 V MLP (HBM(3)) 3. Human body model. –4000 4000 V MLP (MM(4)) 4. Machine model. –500 500 V |
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