33884 datasheet(8/21 Pages) FREESCALE

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Analog Integrated Circuit Device Data

Freescale Semiconductor

33884

ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTICS

Time from Rising Edge of CS to SO High Impedance (13)

tSO(DIS)

—

110

Time from Falling Edge of SCLK to SO Data Valid (14)

tVALID

—

105

Recovery Time for Sequential Transfers

tREC

—

100

120

Notes

Time required for output states data to be terminated at SO pin.

Time required to obtain valid data out from SO following the falling edge of SCLK.

Table 4. Dynamic Electrical Characteristics (continued)

Characteristics noted under conditions 4.75 V ≤ VDD ≤ 5.25 V, 9.0 V ≤ VPWR ≤ 16 V, -40°C ≤ TC ≤ 105°C, unless otherwise

noted. Typical values, where applicable, reflect the approximate parameter mean with VPWR = 13 V, TA = 25°C under nominal

conditions, unless otherwise noted.

Characteristic

Symbol

Min

Typ

Max

Unit

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