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ADC3908CSSS bảng dữ liệu(PDF) 48 Page - Texas Instruments

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Giải thích chi tiết về linh kiện  ADC3910Dx and ADC3910Sx 10-bit, 25 to 125MSPS Low Latency, Low Power, Small, Single and Dual Channel ADC with Integrated Input Buffers
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6.3.7 Digital Interface
The ADC39xx family supports multiple CMOS output modes - parallel DDR/HDDR, SDR, and serialized CMOS
output formats. The output data can be configured to two's complement (default) or offset binary via SPI write
(0x30A).
6.3.7.1 Parallel CMOS Output
The ADC3910Dx and ADC3910Sx supports double data rate (DDR), half double data rate (HDDR), and single
data rate (SDR). In DDR/HDDR mode, the device generates the output data clock along with inverse data clock.
Single channel ADCs can use SDR mode where data is output on the rising edge of the clock.
By default, DDR mode clocks output data by alternating channel A data on the rising and channel B data on the
falling edge on the same lane. This behavior can be changed to clock all of channel A data first and then channel
B data via SPI write to DDR_MODE (0x0A6). HDDR mode clocks channel A data on separate output lanes from
channel B data via SPI write to HDDR_EN (0x098).
For receivers that cannot clock data on the falling edge of data clock, inverse data clock can be used to clock
data on rising edge.
See Section 5.11 section for timing diagrams for parallel CMOS output.
6.3.7.2 Serialized CMOS Output
In this operation, the output data is serialized and transmitted over fewer lanes. Due to CMOS output speed
limitation, the operation is only available for reduced output data rates. See the Section 6.3.6.1.4 section for
details on serial CMOS output.
6.3.8 Test Patterns
To enable in-circuit testing of the digital interface, the following test patterns are supported and enabled via SPI
register writes. There are 2 test pattern generators available in the device. One located in the digital block when
using the DDC, statistics engine or comparator functions and a second available in low latency (digital bypassed)
mode.
ADC
Dig Test
Pattern
Output
Formatter
16/12/10/8-bit
DIG
I/F
Output
Bit Mapper
Channel
Correction
Statistics
Engine
ALERT
Test
Pattern
N
Comparator
SPI I/F
Figure 6-32. Test pattern block diagram
ADC3910D025, ADC3910D065, ADC3910D125
ADC3910S025, ADC3910S065, ADC3910S125
SBASAD1A – DECEMBER 2023 – REVISED MAY 2024
www.ti.com
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Product Folder Links: ADC3910D025 ADC3910D065 ADC3910D125 ADC3910S025 ADC3910S065 ADC3910S125



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