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ZHT431C01STZ bảng dữ liệu(PDF) 3 Page - Zetex Semiconductors

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Giải thích chi tiết về linh kiện  Adjustable precision Zener shunt regulator
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ZHT431
Issue 5 - October 2006
3
www.zetex.com
© Zetex Semiconductors plc 2006
Electrical characteristics test conditions (unless otherwise stated):Tamb=25°C
Deviation of reference input voltage, VDEV, is defined as the maximum variation of the reference
input voltage over the full temperature range.
The average temperature coefficient of the reference input voltage, VREF is defined as:
The dynamic output impedance, RZ, is defined as:
When the device is programmed with two externalresistors, R1
and R2, (fig 2) , the dynamic
outputimpedance of the overall
circuit, R’, is defined as:
Symbol Parameter
Value
Units Conditions
Min.
Typ.
Max.
VREF
Reference voltage
2%
2.45
2.50
2.55
V
IL=10mA (Fig.1),
VZ=VREF
1%
2.475
2.50
2.525
V
VDEV
Deviation of reference input
voltage over temperature
10
30
mV
IL=10mA, VZ=VREF
Tamb=full range (Fig1)
Ratio of the change in
reference voltage to the
change in cathode voltage
-1.85
-2.7
mV/V VZ from VREF to 10V
IZ=10mA (Fig.2)
-1.0
-2.0
mv/V VZ from 10V to 20V
IZ=10mA (Fig.2)
IREF
Reference input current
0.12
1.0
A
R1=10k, R2=O/C,
lL=10mA (Fig.2)
IREF
Deviation of reference input
current over temperature
0.04
0.2
A
R1=10k, R2=O/C,
IL=10mA Tamb=full
range (Fig.2)
IZmin
Minimum cathode current
for regulation
35
50
AVZ=VREF (Fig.1)
IZoff
Off-state current
0.1
AVZ=20V, VREF=0V(Fig.3)
RZ
Dynamic output impedance
0.75
VZ=VREF (Fig.1), f=0Hz,
IC=1mA to 100mA
∆V
REF
∆V
Z
-----------------
Vmax
Vmin
T1
T2
Vdev =Vmax -Vmin
Temperature
V
REF
ppm
°C
-------------⎠
V
DEV x 1000000
V
REF T1
T2
()
------------------------------------------
=
R
Z
V
Z
I
Z
----------
=
R
R
Z 1
R1
R2
-------
+
()
=



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