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AT89C5131A-RDTIM bảng dữ liệu(PDF) 160 Page - ATMEL Corporation

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AT89C5130A/31A-M
4337G–USB–11/06
Notes:
1. Operating ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (see Figure 81.), VIL =
VSS + 0.5V,
VIH = VCC - 0.5V; XTAL2 N.C.; EA = RST = Port 0 = VCC. ICC would be slightly higher if a crystal oscillator used (see Figure
78.).
2. Idle ICC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns, VIL = VSS + 0.5V, VIH = VCC -
0.5V; XTAL2 N.C; Port 0 = VCC; EA = RST = VSS (see Figure 79).
3. Power-down ICC is measured with all output pins disconnected; EA = VCC, PORT 0 = VCC; XTAL2 NC.; RST = VSS (see Fig-
ure 80.). In addition, the WDT must be inactive and the POF flag must be set.
4. Under steady state (non-transient) conditions, IOL must be externally limited as follows:
Maximum IOL per port pin: 10 mA
Maximum IOL per 8-bit port:
Port 0: 26 mA
Ports 1, 2 and 3: 15 mA
Maximum total IOL for all output pins: 71 mA
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater
than the listed test conditions.
Figure 78.
ICC Test Condition, Active Mode
Figure 79.
ICC Test Condition, Idle Mode
EA
VCC
VCC
ICC
(NC)
CLOCK
SIGNAL
All other pins are disconnected.
RST
XTAL2
XTAL1
VSS
VCC
P0
RST
EA
XTAL2
XTAL1
VSS
VCC
VCC
ICC
(NC)
P0
VCC
All other pins are disconnected.
CLOCK
SIGNAL
VCC



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