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ABSOLUTE MAXIMUM RATINGS

RECOMMENDED OPERATING CONDITIONS

DIR9001

SLES198 – DECEMBER 2006

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

VALUE

UNIT

Supply voltage

–0.3 to 4

V

Supply voltage differences

±0.1

V

AGND to DGND

Ground voltage differences

±0.1

V

Digital input

–0.3 to 6.5

Digital input voltage

V

Digital output

XTI, XTO

Analog input voltage

V

FILT

Input current (any pins except supplies)

±10

mA

Ambient temperature under bias

–40 to 125

°C

Storage temperature

–55 to 150

°C

Junction temperature

150

°C

Lead temperature (soldering)

260

°C, 5 s

Package temperature (reflow, peak)

260

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

over operating free-air temperature range (unless otherwise noted)

MIN

NOM

MAX

UNIT

Analog supply voltage

2.7

3.3

3.6

VDC

Digital supply voltage

2.7

3.3

3.6

VDC

XTI is connected to clock source

24.576

MHz

Digital input clock frequency

XTI is connected to DGND

Not required

MHz

Digital output load capacitance, except SCKO

20

pF

Digital output load capacitance (SCKO)

10

pF

Operating free-air temperature

–40

85

°C

2

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