SPECIFICATION AND PERFORMANCE

SERIES:

115B Series

FILE:

115B Series_spec

DATE:

2012/12/12

The information contained herein is exclusive property of. Do not copy and print except that Attend accepts.

本文件係屬立威科技股份有限公司所有；非經同意，不得以任何覆寫、拷貝、翻印等方式私自據有。亦不得擅加毀損、塗改。

-3 -

Vibration

No Damage

Contact Resistance:

30milliohms MAX

Change from initial:

30milliohms

Discontinuity:

1microsecond Max.

(EIA-364-28)

Amplitude:1.52mm P-P or 1.47mm/s^2

Sweep time:10~55~10Hz in 20 minutes

Duration:12 time in each

(total of 36 times)

Electrical: DC 100 mA current

Load shall be flowed during the test

ENVIRONMENTAL

Item

Requirement

Test Condition

Thermal Shock

No evidence of damage.

(EIA 364-32 I)

Subject mated connectors should be

tested according to the condition listed

below:

Temperature: -25 ~ 85℃

Cycles: 5 cycles

Exposure time at temp. 30 minutes.

Humidity

No appearance

damaged

(EIA 364-31)

Mate a dummy card and expose to 60±2℃

for 96 hours Relative humidity 90.

Upon completion of the exposure period,

the test specimens shall be conditioned at

anibient room conditions for 1 to

2hours,after which the specified

measurements shall be performed