PLUS16R4DA datasheet(10/16 Pages) PHILIPS

10 / 16 page

Philips Semiconductors Programmable Logic Devices

Product specification

PLUS16R8D/-7 SERIES

PAL devices

16L8, 16R8, 16R6, 16R4

September 10, 1993

DC ELECTRICAL CHARACTERISTICS

°C ≤ Tamb ≤ +75°C, 4.75 ≤ VCC ≤ 5.25V

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

MIN

TYP1

MAX

UNIT

Input voltage2

VIL

Low

VCC = MIN

0.8

VIH

High

VCC = MAX

2.0

VIC

Clamp

VCC = MIN, IIN = –18mA

–0.8

–1.5

Output voltage

VCC = MIN, VIN = VIH or VIL

VOL

Low

IOL = 24mA

0.5

VOH

High

IOH = –3.2 mA

2.4

Input current

VCC = MAX

IIL

Low3

VIN = 0.40V

–250

µA

IIH

High3

VIN = 2.7V

µA

Maximum input current

VIN = VCC = VCCMAX

100

µA

Output current

VCC = MAX

IOZH

Output leakage

VOUT = 2.7V

100

µA

IOZL

Output leakage

VOUT = 0.4V

–100

µA

IOS

Short circuit 4, 5

VOUT = 0V

–30

–90

ICC

VCC supply current

VCC = MAX

160

180

Capacitance6

CIN

Input

VCC = 5V

VOUT = 2.0V

I/O (B)

VOUT = 2V, f = 1MHz

NOTES:

1. All typical values are at VCC = 5V, Tamb = +25°C.

2. All voltage values are with respect to network ground terminal.

3. Leakage current for bidirectional pins is the worst case of IIL and IOZL or IIH and IOZH.

4. Test one at a time.

5. Duration of short circuit should not exceed 1 second.

6. These parameters are not 100% tested but periodically sampled.

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