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TPS73047DBVR bảng dữ liệu(PDF) 2 Page - Texas Instruments |
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TPS73047DBVR bảng dữ liệu(HTML) 2 Page - Texas Instruments |
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2 / 16 page ![]() www.ti.com ABSOLUTE MAXIMUM RATINGS TPS730xx SBVS054G – NOVEMBER 2004 – REVISED DECEMBER 2006 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. ORDERING INFORMATION(1) PRODUCT VOUT(2) TPS730xxyyyz XX is nominal output voltage (for example, 28 = 2.8V, 01 = Adjustable). YYY is package designator. Z is package quantity. (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. (2) Output voltages from 1.2V to 4.5V in 50mV increments are available through the use of innovative factory EEPROM programming; minimum order quantities may apply. Contact factory for details and availability. over operating temperature range (unless otherwise noted)(1) UNIT VIN range –0.3V to +6V VEN range –0.3V to VIN + 0.3V VOUT range –0.3V to VIN + 0.3V Peak output current Internally limited ESD rating, HBM 2kV ESD rating, CDM 500V Continuous total power dissipation See Dissipation Ratings Table Junction temperature range –40 °C to +150°C Storage temperature range, Tstg –65 °C to +150°C (1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2 Submit Documentation Feedback |
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