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SCD6C60S bảng dữ liệu(PDF) 2 Page - HAOPIN MICROELECTRONICS CO.,LTD |
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SCD6C60S bảng dữ liệu(HTML) 2 Page - HAOPIN MICROELECTRONICS CO.,LTD |
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2 / 5 page ![]() Limiting values in accordance with the Maximum system(IEC 134) 2/5 http://www.haopin.com HAOPIN MICROELECTRONICS CO.,LTD. TM HPM SCRs SYMBOL PARAMETER CONDITIONS MIN Value UNIT SYMBOL CONDITIONS MIN V RRM I T(RMS) Repetitive peak reverse voltage RMS on-state current V I GM Peak gate current - 600 - - T =25 C unless otherwise stated J O Static characteristics I GT V TM V DI/Dt GT I I DRM RRM DC gate trigger voltage Maximum rate-of-rise of on-state current; Dc gate trigger current On-state voltage Peak off-state forward and reverse current at V and V DRM RRM Tc=125 ,V Tc=125 ,V DRM RRM UNIT MAX TYP 1.6 - - 100 - - - - - - - 6 0.5 0.5 mA mA VD=12V,RL=60 VD=12V dc,RL=60 IGT=150mA with<=0.1 s rise time, Ta=25 ,itm=0.6A,instantaneous value - - - 1.5 200 - - V A/ s V A A A 6 2 41 I TSM It 2 I t for fusing 2 T tg Tq P GM Peak one-cycle forward surge current Average gate power dissipation Peak gate power dissipation Gate controlled tum-on time;gate pulse=100mA; minmum width=15 s with rise time=<0.1 s Circuit commutated tum-off time RMS surge (non-repetitive)on-state current for period of 8.3ms for fusing 60Hz 50Hz A A - - - - - 20 - - s s W W As 2 100 83 0.5 20 35 I H P G(AV) PARAMETER V =12V; I =0.1A DGT Dynamic Characteristics D/dt VD t gt t g Critical rate of rise of Off-state voltage Gate controlled turn-on Crcuit commutated tum- off time time 50 - - - - - 100 2 100 V =67% V ;Tj=125 ; DM DRM(max) Exponential wave form;R =100 GK I =10A;V =V ; TM D DRM(max) I=5mA; G Dl /dt=0.2A/ s G dv /dt=2V/ s;R =1k DGK s s V/ s V =67% V ;Tj=125 ;I =12A V =24V;dI /dt=10A/ S DM DRM(max) TM RTM SCD6C60S |
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