COMMERCIALTEMPERATURERANGE

2

IDTCV115F

PROGRAMMABLEFLEXPC™CLOCKFORP4PROCESSOR

PIN CONFIGURATION

SSOP

TOP VIEW

56

55

54

53

52

51

50

49

48

47

46

45

44

43

42

41

40

39

38

37

36

35

34

33

32

31

30

29

PCI1

PCI0

FS_A

REF0

VSS_REF

XTAL_IN

XTAL_OUT

VDD_REF

SCL

SDA

CPUT0

CPUC0

VDD_CPU

CPUT1

CPUC1

IREF

FS_B/Test_Mode

CPU2_ITP/SRCT7

CPU2_ITP/SRCC7

VDD_SRC

SRCC6

SRCT5

SRCC5

VSS_SRC

1

2

3

4

5

6

7

8

9

10

11

12

13

14

15

16

17

18

19

20

21

22

23

24

25

26

27

28

VDD_PCI

VSS_PCI

PCI2

PCI3

PCI4

VSS_PCI

VDD_PCI

PCIF0/ITP_EN

PCIF1

VTT_PWRGD#/PWRDWN

VDD_48

USB48MHz

VSS_48

DOT_96

DOT_96#

PCIF2

SRCT1

SRCC1

VDD_SRC

SRCT2

SRCC2

SRCT3

SRCC3

SRCT4_SATA

VDD_SATA

SRCT6

VSS_SRC

VSS_SATA

SRCC4_SATA

VDD_suspend

VSS_CPU

FS_C/Test _Sel

HW FREQUENCY SELECTION TABLE

FSC, B, A

CPU

SRC4_SATA

SRC[3:1], SCR[7:5]

PCI

USB

DOT

REF

101

100

100

100

33.3

48

96

14.318

001

133

100

100

33.3

48

96

14.318

011

166

100

100

33.3

48

96

14.318

010

200

100

100

33.3

48

96

14.318

000

266

100

100

33.3

48

96

14.318

100

333

100

100

33.3

48

96

14.318

110

400

100

100

33.3

48

96

14.318

111

Reserve

100

100

33.3

48

96

14.318

ITP_EN

pin 38

pin 39

1

CPUC2_ITP

CPUT_ITP

0

SRCC7

SRCT7

ITP_EN

TEST MODE SELECT(1)

If TEST_SEL sampled above 2V at VTT_PWRGD active LOW

Pin38

(test_mode)

CPU

SRC

PCI/F

REF

DOT96

USB

1

REF/N

REF/N

REF/N

REF

REF/N

REF/N

0

Hi-Z

Hi-Z

Hi-Z

Hi-Z

Hi-Z

Hi-Z

NOTE:

1. Once test clock operation has been invoked, TEST_MODE pin will select between

the Hi-Z and REF/N.

Symbol

Description

Min

Max

Unit

VDDA

3.3V Core Supply Voltage

4.6

V

VDD

3.3V Logic Input Supply Voltage GND - 0.5

4.6

V

TSTG

Storage Temperature

–65

+150

° C

TAMBIENT

Ambient Operating Temperature

0

+70

° C

TCASE

Case Temperature

+115

° C

ESD Prot

Input ESD Protection

2000

V

Human Body Model

ABSOLUTE MAXIMUM RATINGS(1)

NOTE:

1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause

permanent damage to the device. This is a stress rating only and functional operation

of the device at these or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect reliability.