STM32H7 datasheet(175/357 Pages) STMICROELECTRONICS

175 / 357 page

DS12110 Rev 10

175/357

STM32H742xI/G STM32H743xI/G

Electrical characteristics (rev Y)

320

Offset1

Offset error at code

0x001(4)

DAC output buffer OFF,

CL ≤ 50 pF, no RL

±5

LSB

OffsetCal

Offset error at code

0x800 after factory

calibration

DAC output

buffer ON,

CL ≤ 50 pF,

RL ≥ 5 ㏀

VREF+ = 3.6 V

±5

LSB

VREF+ = 1.8 V

±7

Gain

Gain error(5)

DAC output buffer ON,CL ≤ 50 pF,

RL ≥ 5 ㏀

±1

DAC output buffer OFF,

CL ≤ 50 pF, no RL

±1

TUE

Total unadjusted error

DAC output buffer OFF,

CL ≤ 50 pF, no RL

±12

LSB

SNR

Signal-to-noise ratio(6)

DAC output buffer ON,CL ≤ 50 pF,

RL ≥ 5 ㏀ , 1 kHz, BW = 500 KHz

67.8

SINAD

Signal-to-noise and

distortion ratio(6)

DAC output buffer ON, CL ≤ 50 pF,

RL ≥ 5 ㏀ , 1 kHz

67.5

ENOB

Effective number of

bits

DAC output buffer ON,

CL ≤ 50 pF, RL ≥ 5 ㏀ , 1 kHz

10.9

bits

1. Guaranteed by characterization.

2. Difference between two consecutive codes minus 1 LSB.

3. Difference between the value measured at Code i and the value measured at Code i on a line drawn between Code 0 and

last Code 4095.

4. Difference between the value measured at Code (0x001) and the ideal value.

5. Difference between the ideal slope of the transfer function and the measured slope computed from code 0x000 and 0xFFF

when the buffer is OFF, and from code giving 0.2 V and (VREF+ - 0.2 V) when the buffer is ON.

6. Signal is -0.5dBFS with Fsampling=1 MHz.

Table 90. DAC accuracy(1) (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

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