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STM32H7 bảng dữ liệu(PDF) 135 Page - STMicroelectronics

tên linh kiện STM32H7
Giải thích chi tiết về linh kiện  32-bit Arm® Cortex®-M7 480MHz MCUs, up to 2MB flash, up to 1MB RAM, 46 com. and analog interfaces
PDF  357 Pages
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nhà sản xuất  STMICROELECTRONICS [STMicroelectronics]
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STM32H7 bảng dữ liệu(HTML) 135 Page - STMicroelectronics

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DS12110 Rev 10
135/357
STM32H742xI/G STM32H743xI/G
Electrical characteristics (rev Y)
320
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application,
executing EEMBC code, is running. This emission test is compliant with SAE IEC61967-2
standard which specifies the test board and the pin loading.
Table 56. EMI characteristics for fHSE = 8 MHz and fCPU = 400 MHz
Symbol Parameter
Conditions
Monitored
frequency band
Max vs.
[fHSE/fCPU]
Unit
8/400 MHz
SEMI
Peak (1)
VDD = 3.6 V, TA = 25 °C, UFBGA240 package,
compliant with IEC61967-2
0.1 MHz to
30 MHz
6
dBµV
30 MHz to
130 MHz
5
130 MHz to 1 GHz
13
1 GHz to 2 GHz
7
Level (2)
0.1 MHz to 2 GHz
2.5
-
1. Refer to AN1709 “EMI radiated test” chapter.
2. Refer to AN1709 “EMI level classification” chapter.



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