4

INDUSTRIALTEMPERATURERANGE

IDT74FCT16501AT/CT

FASTCMOS18-BITREGISTEREDTRANSCEIVER

Symbol

Parameter

Test Conditions(1)

Min.

Typ.(2)

Max.

Unit

ΔICC

Quiescent Power Supply

VCC = Max.

—

0.5

1.5

mA

Current TTL Inputs HIGH

VIN = 3.4V(3)

ICCD

Dynamic Power Supply Current(4)

VCC = Max.,

VIN = VCC

—

75

120

µA/

OutputsOpen

VIN = GND

MHz

OEAB =

OEBA = VCC or GND

OneInputToggling

50% Duty Cycle

IC

Total Power Supply Current(6)

VCC = Max.,

VIN = VCC

—

0.8

1.7

mA

OutputsOpen

VIN = GND

fCP = 10MHz (CLKAB)

50% Duty Cycle

OEAB =

OEBA = VCC

LEAB = GND

VIN = 3.4V

—

1.3

3.2

One Bit Toggling

VIN = GND

fi = 5MHz

50% Duty Cycle

VCC = Max.,

VIN = VCC

—

3.8

6.5(5)

OutputsOpen

VIN = GND

fCP = 10MHz (CLKAB)

50% Duty Cycle

OEAB =

OEBA = VCC

LEAB = GND

VIN = 3.4V

—

8.5

20.8(5)

EighteenBitsToggling

VIN = GND

fi = 2.5MHz

50% Duty Cycle

POWER SUPPLY CHARACTERISTICS

NOTES:

1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.

4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.

5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.

6. IC = IQUIESCENT + IINPUTS + IDYNAMIC

IC = ICC +

ΔICC DHNT + ICCD (fCPNCP/2 + fiNi)

ICC = Quiescent Current (ICCL, ICCH and ICCZ)

ΔICC = Power Supply Current for a TTL High Input (VIN = 3.4V)

DH = Duty Cycle for TTL Inputs High

NT = Number of TTL Inputs at DH

ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)

fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)

NCP = Number of Clock Inputs at fCP

fi = Input Frequency

Ni = Number of Inputs at fi