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SN74LVC1G0832DBVT bảng dữ liệu(PDF) 1 Page - Texas Instruments

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Giải thích chi tiết về linh kiện  SINGLE 3-INPUT POSITIVE AND-OR GATE
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Trang chủ  http://www.ti.com
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SN74LVC1G0832DBVT bảng dữ liệu(HTML) 1 Page - Texas Instruments

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SN74LVC1G0832
SINGLE 3INPUT POSITIVE ANDOR GATE
SCES606 − SEPTEMBER 2004
1
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
D Available in the Texas Instruments
NanoStar
 and NanoFree Packages
D Supports 5-V VCC Operation
D Inputs Accept Voltages to 5.5 V
D Max tpd of 5 ns at 3.3 V
D Low Power Consumption, 10-µA Max ICC
D ±24-mA Output Drive at 3.3 V
D Input Hysteresis Allows Slow Input
Transition and Better Switching Noise
Immunity at the Input
(Vhys = 250 mV Typ @ 3.3 V)
D Can Be Used in Three Combinations:
− AND-OR Gate
− AND Gate
− OR Gate
D Ioff Supports Partial-Power-Down Mode
Operation
D Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
D ESD Protection Exceeds JESD 22
− 2000-V Human-Body Model (A114-A)
− 200-V Machine Model (A115-A)
− 1000-V Charged-Device Model (C101)
description/ordering information
This device is designed for 1.65-V to 5.5-V VCC operation.
The SN74LVC1G0832 is a single 3-input positive AND-OR gate. It performs the Boolean function
Y
+ (A • B) ) C in positive logic.
ORDERING INFORMATION
TA
PACKAGE†
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING‡
NanoStar
 − WCSP (DSBGA)
0.23-mm Large Bump − YEP
Reel of 3000
SN74LVC1G0832YEPR
_ _ _ _
−40 C to 85 C
NanoFree
 − WCSP (DSBGA)
0.23-mm Large Bump − YZP (Pb-free)
Reel of 3000
SN74LVC1G0832YZPR
_ _ _ _
−40
°C to 85°C
SOT (SOT-23) − DBV
Reel of 3000
SN74LVC1G0832DBVR
CDC_
SOT (SOT-23) − DBV
Reel of 250
SN74LVC1G0832DBVT
CDC_
SOT (SC-70) − DCK
Reel of 3000
SN74LVC1G0832DCKR
DC_
SOT (SC-70) − DCK
Reel of 250
SN74LVC1G0832DCKT
DC_
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
‡ DBV/DCK: The actual top-side marking has one additional character that designates the assembly/test site.
YEP/YZP: The actual top-side marking has three preceding characters to denote year, month, and sequence code, and one
following character to designate the assembly/test site. Pin 1 identifier indicates solder-bump composition
(1 = SnPb,
• = Pb-free).
Copyright
 2004, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar and NanoFree are trademarks of Texas Instruments.
DBV OR DCK PACKAGE
(TOP VIEW)
1
2
3
6
5
4
A
GND
B
C
VCC
Y
3
2
1
4
5
6
B
GND
A
Y
VCC
C
YEP OR YZP PACKAGE
(BOTTOM VIEW)
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.


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