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SSTVF16859 bảng dữ liệu(PDF) 9 Page - NXP Semiconductors

tên linh kiện SSTVF16859
Giải thích chi tiết về linh kiện  13-bit 1:2 SSTL_2 registered buffer for DDR
PDF  15 Pages
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nhà sản xuất  PHILIPS [NXP Semiconductors]
Trang chủ  http://www.nxp.com
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SSTVF16859 bảng dữ liệu(HTML) 9 Page - NXP Semiconductors

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Philips Semiconductors
Product data sheet
SSTVF16859
13-bit 1:2 SSTL_2 registered buffer for DDR
2004 Jul 12
9
TIMING REQUIREMENTS—PC1600–PC2700
Over recommended operating conditions; Tamb = 0 °C to +70 °C (unless otherwise noted) (see Figure 1)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
VDD = 2.5 V ± 0.2 V
UNIT
MIN
MAX
fclock
Clock frequency
—
200
MHz
tw
Pulse duration, CK, CK HIGH or LOW
2.5
—
ns
tact
Differential inputs active time
Notes 1, 2
—
22
ns
tinact
Differential inputs inactive time
Notes 1, 3
—
22
ns
t
Setup time, fast slew rate
(see Notes 4 and 6)
Data before CK
↑ CK↓
0.65
ns
tsu
Setup time, slow slew rate
(see Notes 5 and 6)
Data before CK
↑, CK↓
0.75
ns
t
Hold time, fast slew rate
(see Notes 4 and 6)
Data after CK
↑ CK↓
0.75
ns
th
Hold time, slow slew rate
(see Notes 5 and 6)
Data after CK
↑, CK↓
0.9
ns
NOTES:
1. This parameter is not necessarily production tested.
2. Data inputs must be below a minimum time of tact max, after RESET is taken HIGH.
3. Data and clock inputs must be held at valid levels (not floating) a minimum time of tinact max, after RESET is taken LOW.
4. For data signal input slew rate
≥ 1 V/ns.
5. For data signal input slew rate
≥ 0.5 V/ns and < 1 V/ns.
6. CK, CK signals input slew rates are
≥ 1 V/ns.
TIMING REQUIREMENTS—PC3200
Over recommended operating conditions; Tamb = 0 °C to +70 °C (unless otherwise noted) (see Figure 1)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
VDD = 2.6 V ± 0.1 V
UNIT
MIN
MAX
fclock
Clock frequency
—
210
MHz
tw
Pulse duration, CK, CK HIGH or LOW
2.5
—
ns
tact
Differential inputs active time
Notes 1, 2
—
22
ns
tinact
Differential inputs inactive time
Notes 1, 3
—
22
ns
t
Setup time, fast slew rate
(see Notes 4 and 6)
Data before CK
↑ CK↓
0.65
ns
tsu
Setup time, slow slew rate
(see Notes 5 and 6)
Data before CK
↑, CK↓
0.75
ns
t
Hold time, fast slew rate
(see Notes 4 and 6)
Data after CK
↑ CK↓
0.65
ns
th
Hold time, slow slew rate
(see Notes 5 and 6)
Data after CK
↑, CK↓
0.8
ns
NOTES:
1. This parameter is not necessarily production tested.
2. Data inputs must be below a minimum time of tact max, after RESET is taken HIGH.
3. Data and clock inputs must be held at valid levels (not floating) a minimum time of tinact max, after RESET is taken LOW.
4. For data signal input slew rate
≥ 1 V/ns.
5. For data signal input slew rate
≥ 0.5 V/ns and < 1 V/ns.
6. CK, CK signals input slew rates are
≥ 1 V/ns.



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