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USB-2633 bảng dữ liệu(PDF) 4 Page - List of Unclassifed Manufacturers

tên linh kiện USB-2633
Giải thích chi tiết về linh kiện  16-Bit, 1 MS/s, High-Speed Data Acquisition
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USB-2633 bảng dữ liệu(HTML) 4 Page - List of Unclassifed Manufacturers

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Measurement Computing
(508) 946-5100
4
info@mccdaq.com
mccdaq.com
USB-2600 Series
Specifications
Specifications
All specifications are subject to change without notice.
Typical for 25 °C unless otherwise specified.
Analog Input
A/D converter (ADC) type: Successive approximation; 16-bit resolution
Number of channels
USB-2623/USB-2627: 16 SE
USB-2633/USB-2637: 64 SE
Input voltage range: ±10 V
Absolute maximum input voltage
CHx relative to AGND: ±25 V max (power on), ±10.5 V max (power off)
Input impedance: 1 GΩ (power on), 390 Ω (power off)
Input bias current: ±100 pA
Input bandwidth: Small signal (–3 dB): 3.1 MHz
Input capacitance: 40 pf
Maximum working voltage: ±10.1 V max relative to AGND
Crosstalk
Adjacent channels, DC to 10 kHz: –80 dB
Input coupling: DC
Sample rate: 0.0149 S/s to 1,000 kS/s; software selectable
Trigger source: TTLTRG
A/D pacing: Internal input scan clock, external input scan clock (XAPCR)
Burst mode: Burst rate = 1 µs, software selectable,
Throughput
Software paced: 33 S/s to 4,000 S/s typ; system dependent
Hardware paced: 1 MS/s max
Channel queue
USB-2623/USB-2627: Up to 16 element list of random channels
USB-2633/USB-2637: Up to 64 element list of random channels
Warm-Up Time: 15 minutes min
Accuracy
Analog Input DC Voltage Measurement Accuracy
Range: ±10 V
Gain error (% of reading): 0.031
Offset error: 915 µV
INL error (% of Range): 0.0076
Absolute accuracy at full scale: 4775 µV
Gain temperature coefficient (% reading/°C): 0.0013
Offset temperature coefficient (µV/°C): 35
Noise Performance
For peak-to-peak noise distribution test, the input channel connects to AGND at the
input terminal block, and 32,000 samples are acquired at the maximum throughput.
Range: ±10 V
Counts: 8
LSBrms: 1.21
Settling Time for Multichannel Measurements
Range: ±10 V
1 µS settling accuracy (% FSR): 0.0152
5 µS settling accuracy (% FSR): 0.0061
10 µS settling accuracy (% FSR): 0.0015
Analog Input/Output Calibration
Recommended warm-up time: 15 minutes min
Calibration method: Self-calibration (firmware)
Calibration interval: 1 year (factory calibration)
AI calibration reference: 5 V, ±2.5 mV max. Measured values stored in EEPROM.
Tempco: 5 ppm/°C max
Long term stability: 15 ppm/1,000 hours
AO calibration procedure (USB-2627/USB-2637 only): Analog output pins
internally routed to the analog input circuit. For best results, disconnect any
XDACx connections at the I/O connectors before performing AOUT calibration.
Analog Output (USB-2627/USB-2637 Only)
Number of channels: 4; leave unused analog output channels disconnected.
Resolution: 16 bits
Output ranges (calibrated): ±10 V
Output transient
Host computer is reset, powered on, suspended, or a reset command is
issued to the device (analog outputs default to 0 V)
Duration: 100 ms
Amplitude: 2 V p-p
Powered Off
Duration: 100 ms
Amplitude: 5 V peak
Differential nonlinearity: ±0.25 LSB typ, ±1 LSB max
Output Current
XDACx pins: ±3.5 mA max
Output short-circuit protection
XDACx connected to AGND: Unlimited duration
Output coupling: DC
Power on and reset state
DACs cleared to zero-scale: 0 V, ±150 mV
Pacer source: Internal output scan clock and external output scan clock (XDPCR),
independent of external input scan clock (XAPCR)
Trigger sources: TTLTRIG (refer to the “External Trigger” specifications below)
Output update rate: 1 MS/s max; not affected by the number of scan channels
Settling time to rated accuracy, 10 V step: 2 µs
Slew rate: 20 V/µs
Throughput
Software paced: 33 S/s to 4,000 S/s typ, system-dependent
Hardware paced: 1 MS/s max, system-dependent
Calibrated Absolute Accuracy
Range: ±10 V
% of reading: ±0.0183
Offset: ±1.831
Offset Tempco: 12.7 µV/°C)
Gain Tempco: 13 ppm of range/°C)
Relative Accuracy (±LSB)
Range: ±10 V
Relative Accuracy (INL): 4.0 typ
Digital Input/Output
Digital type: TTL
Number of I/O: 24
Configuration: Three banks of 8. Bit-configurable as input or output.
Pull-up configuration: Each port has jumper- configurable 47 kΩ resistors.
Digital I/O transfer rate (system paced, asynchronous): 33 to 4,000 port reads/
writes or single bit reads/writes per second typ; system dependent.
Input high voltage: 2.0 V min, 5.0 V absolute max
Input low voltage: 0.8 V max, 0 V recommended min
Output high voltage: 4.4 V min (IOH = –50 µA),
3.76 V min (IOH = –24 mA)
Output low voltage: 0.1 V max (IOL = 50 µA)
0.44 V max (IOL = 24 mA)
Output current: 60 mA max, not to exceed 24 mA for one bit, resulting in 2.5 mA
max when all 24 bits are enabled.
External Trigger
Trigger source: TTLTRG
Trigger mode: edge or level sensitive, rising or falling edge, high or low level
Trigger latency: 1 µs + 1 clock cycle max
Trigger pulse width: 100 ns min
Input type: 33 Ω series resistor and 49.9 kΩ pull-down to GND
Input high voltage: 2.2 V min, 5.5 V absolute max
Input low voltage: 1.5 V max, –0.5 V absolute min, 0 V recommended min
External Clock
Terminal names: XAPCR, XDPCR
Terminal types: Input, active on rising edge
Terminal descriptions: Receives pacer clock from external source
Input clock rate: 1 MHz max
Clock pulse width: 100 ns min
Input type: 33 Ω series resistor, 47 kΩ pull-down to GND
Input high voltage: 2.2 V min, 5.5 V absolute max
Input low voltage: 1.5 V max, –0.5 V absolute min, 0 V recommended min



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