74F862 datasheet(6/12 Pages) PHILIPS

6 / 12 page

Philips Semiconductors

Product specification

74F862, 74F863

Bus transceivers (3-State)

2000 Mar 24

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS1

MIN

TYP2

MAX

UNIT

VCC = MIN,

VIL = MAX

IO =1 mA

±10%VCC

2.4

High level output voltage

VIL = MAX,

VIH = MIN

IOH = –1 mA

±5%VCC

2.4

3.3

VOH

High-level output voltage

VCC = MIN,

VIL = MAX

IO =24 mA

±10%VCC

2.0

VIL = MAX,

VIH = MIN

IOH = –24 mA

±5%VCC

2.0

Low level output voltage

VCC = MIN,

VIL = MAX

IOL = –48 mA

±10%VCC

0.38

0.55

VOL

Low-level output voltage

VIL = MAX,

VIH = MIN

IOL = 64 mA

±5%VCC

0.42

0.55

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73

–1.2

Input current at

maximum input voltage

OEAB, OEBA

OEABn, OEBAn

VCC = 0.0 V, VI = 7.0 V

100

µA

maximum input voltage

An, Bn

VCC = 5.5 V, VI = 5.5 V

IIH

High-level input current

VCC = MAX, VI = 2.7 V

µA

IIL

Low-level input current

VCC = MAX, VI = 0.5 V

–20

µA

IIH + IOZH

Off-state output current

High-level voltage applied

VCC = MAX, VO = 2.7 V

µA

IIL + IOZL

Off-state output current

Low-level voltage applied

An, Bn

VCC = MAX, VO = 0.5 V

–70

µA

IOS

Short-circuit output current3

VCC = MAX

–100

–225

ICCH

145

195

An, Bn

74F863

ICCL

VCC = MAX

140

195

ICCZ

165

220

ICC

Supply current total

ICCH

130

74F862

ICCL

VCC = MAX

120

170

ICCZ

130

160

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5 V, Ta = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

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