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74F821 bảng dữ liệu(PDF) 10 Page - NXP Semiconductors |
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74F821 bảng dữ liệu(HTML) 10 Page - NXP Semiconductors |
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10 / 18 page  Philips Semiconductors Product specification 74F821/822/823/824/825/826 Bus interface registers 1996 Jan 05 10 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIk Input clamp current –18 mA IOH High–level output current –24 mA IOL Low–level output current 64 mA T b Operating free-air temperature range Commercial range 0 +70 °C Tamb O erating free-air tem erature range Industrial range –40 +85 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONS1 LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONS1 MIN TYP2 MAX UNIT IO = 15mA ±10%VCC 2.4 V VO High level output voltage VCC = MIN, VIL = MAX IOH = –15mA ±5%VCC 2.4 V VOH High-level output voltage VIL = MAX, VIH = MIN IO = 24mA ±10%VCC 2.0 V IOH = –24mA ±5%VCC 2.0 V VO Low level output voltage VCC = MIN, VIL = MAX IO = MAX ±10%VCC 0.55 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOL = MAX ±5%VCC 0.42 0.55 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = 0.0V, VI = 7.0V 100 µA IIH High–level input current VCC = MAX, VI = 2.7V 20 µA IIL Low–level input current VCC = MAX, VI = 0.5V –20 µA IOZH Off–state output current, high–level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off–state output current, low–level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short–circuit output current3 VCC = MAX -100 -225 mA ICCH 75 105 mA 74F821, 74F822 ICCL VCC = MAX 75 105 mA 74F822 ICCZ 75 115 mA ICCH 65 100 mA ICC Supply current (total) 74F823, 74F824 ICCL VCC = MAX 70 105 mA 74F824 ICCZ 75 110 mA ICCH 60 85 mA 74F825, 74F826 ICCL VCC = MAX 60 90 mA 74F826 ICCZ 65 95 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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