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7UL1T32FS bảng dữ liệu(PDF) 2 Page - Toshiba Semiconductor

tên linh kiện 7UL1T32FS
Giải thích chi tiết về linh kiện  CMOS Digital Integrated Circuits Silicon Monolithic
PDF  9 Pages
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nhà sản xuất  TOSHIBA [Toshiba Semiconductor]
Trang chủ  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

7UL1T32FS bảng dữ liệu(HTML) 2 Page - Toshiba Semiconductor

  7UL1T32FS Datasheet HTML 1Page - Toshiba Semiconductor 7UL1T32FS Datasheet HTML 2Page - Toshiba Semiconductor 7UL1T32FS Datasheet HTML 3Page - Toshiba Semiconductor 7UL1T32FS Datasheet HTML 4Page - Toshiba Semiconductor 7UL1T32FS Datasheet HTML 5Page - Toshiba Semiconductor 7UL1T32FS Datasheet HTML 6Page - Toshiba Semiconductor 7UL1T32FS Datasheet HTML 7Page - Toshiba Semiconductor 7UL1T32FS Datasheet HTML 8Page - Toshiba Semiconductor 7UL1T32FS Datasheet HTML 9Page - Toshiba Semiconductor  
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7UL1T32FS
2
5. IEC Logic Symbol
6. Truth Table
Input
A
L
L
H
H
Input
B
L
H
L
H
Output
Y
L
H
H
H
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 �)
Characteristics
Supply voltage
Input voltage
DC output voltage
Input diode current
Output diode current
DC output current
VCC/ground current
Power dissipation
Storage temperature
Symbol
VCC
VIN
VOUT
IIK
IOK
IOUT
ICC
PD
Tstg
Note
(Note 1)
(Note 2)
(Note 3)
Rating
-0.5 to 4.6
-0.5 to 4.6
-0.5 to 4.6
-0.5 to VCC + 0.5
-20
-20
±25
±50
50
-65 to 150
Unit
V
V
V
mA
mA
mA
mA
mW
�
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even
destruction.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note 1: VCC = 0 V
Note 2: High (H) or Low (L) state. IOUT absolute maximum rating must be observed.
Note 3: VOUT < GND
2022-02-03
Rev.1.0
©2021-2022
Toshiba Electronic Devices & Storage Corporation



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