33975 datasheet(8/32 Pages) FREESCALE

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Analog Integrated Circuit Device Data

Freescale Semiconductor

33975

STATIC ELECTRICAL CHARACTERISTICS

DIGITAL INTERFACE

Input Logic High-Voltage Thresholds (10)

VIH

0.7 x VDD

–VDD + 0.3

Input Logic Low-Voltage Thresholds (10)

VIL

GND - 0.3

–

0.2 x VDD

SCLK, SI, Tri-State SO Input Current

0.0 V to VDD

ISCLK, ISI,

ISO(Tri)

-10

–

µA

Input Current

= VDD

ICS

-10

–

µA

Pull-Up Current

= 0.0 V

ICS

–

100

µA

SO High-State Output Voltage

ISO(high) = -200 µA

VSO(high)

VDD - 0.8

–

VDD

SO Low-State Output Voltage

ISO(high) = 1.6 mA

VSO(low)

–

0.4

Input Capacitance on SCLK, SI, Tri-State SO (11)

CIN

–

INT

Internal Pull-Up Current

–

100

µA

INT

Voltage

INT

= Open Circuit

VINT(high)

VDD - 0.5

–

VDD

INT

Voltage

IINT = 1.0 mA

VINT(low)

–

0.2

0.4

WAKE

Internal Pull-Up Current

IWAKE(pu)

100

µA

WAKE

Voltage

WAKE

= Open Circuit

VWAKE(high)

4.0

4.3

5.3

WAKE

Voltage

IWAKE = 1.0 mA

VWAKE(low)

–

0.2

0.4

WAKE

Voltage (11)

Maximum Voltage Applied to WAKE Through External Pull-Up

VWAKE(max)

–

Notes

10.

Upper and lower logic threshold voltage levels apply to SI, CS, and SCLK.

11.

This parameter is guaranteed by design however, is not production tested.

Table 4. Static Electrical Characteristics (continued)

Characteristics noted under conditions of 3.0 V ≤ VDD ≤ 5.5 V, 8.0 V ≤ VPWR ≤ 28V, -40°C ≤ TC ≤ 125°C unless otherwise

noted. Where applicable, typical values reflect the parameter’s approximate average value with VPWR = 13 V, TA = 25°C.

Characteristic

Symbol

Min

Typ

Max

Unit

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