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STM32F103XC bảng dữ liệu(PDF) 87 Page - STMicroelectronics |
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STM32F103XC bảng dữ liệu(HTML) 87 Page - STMicroelectronics |
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87 / 143 page ![]() DS5792 Rev 13 87/143 STM32F103xC, STM32F103xD, STM32F103xE Electrical characteristics 135 To complete these trials, ESD stress can be applied directly on the device, over the range of specification values. When unexpected behavior is detected, the software can be hardened to prevent unrecoverable errors occurring (see application note AN1015). Electromagnetic Interference (EMI) The electromagnetic field emitted by the device are monitored while a simple application is executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with IEC 61967-2 standard which specifies the test board and the pin loading. 5.3.12 Absolute maximum ratings (electrical sensitivity) Based on three different tests (ESD, LU) using specific measurement methods, the device is stressed in order to determine its performance in terms of electrical sensitivity. Electrostatic discharge (ESD) Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test conforms to the JESD22-A114/C101 standard. Static latch-up Two complementary static tests are required on six parts to assess the latch-up performance: • A supply overvoltage is applied to each power supply pin • A current injection is applied to each input, output and configurable I/O pin These tests are compliant with EIA/JESD 78A IC latch-up standard. Table 42. EMI characteristics Symbol Parameter Conditions Monitored frequency band Max vs. [fHSE/fHCLK] Unit 8/48 MHz 8/72 MHz SEMI Peak level VDD = 3.3 V, TA = 25 °C, LQFP144 package compliant with IEC 61967-2 0.1 to 30 MHz 8 12 dBµV 30 to 130 MHz 31 21 130 MHz to 1GHz 28 33 SAE EMI Level 4 4 - Table 43. ESD absolute maximum ratings Symbol Ratings Conditions Class Maximum value(1) Unit VESD(HBM) Electrostatic discharge voltage (human body model) TA = +25 °C, conforming to JESD22-A114 22000 V VESD(CDM) Electrostatic discharge voltage (charge device model) TA = +25 °C, conforming to JESD22-C101 III 500 1. Guaranteed by characterization results. |
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