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KAI-2001 bảng dữ liệu(PDF) 17 Page - ON Semiconductor |
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KAI-2001 bảng dữ liệu(HTML) 17 Page - ON Semiconductor |
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17 / 37 page ![]() KAI−2001 www.onsemi.com 16 DEFECT DEFINITIONS Table 7. DEFECT DEFINITIONS Description Definition Maximum Temperature(s) Tested at ( 5C) Notes Major Dark Field Defective Pixel Defect ≥ 179 mV 20 27, 40 1 Major Bright Field Defective Pixel Defect ≥ 15% 20 27, 40 1 Minor Dark Field Defective Pixel Defect ≥ 57 mV 200 27, 40 Cluster Defect A group of 2 to 10 contiguous major defective pixels, but no more than 2 adjacent defects horizontally. 8 27, 40 1 Column Defect A group of more than 10 contiguous major defective pixels along a single column. 0 27, 40 1 1. There will be at least two non-defective pixels separating any two major defective pixels. Defect Map The defect map supplied with each sensor is based upon testing at an ambient (27 °C) temperature. Minor point defects are not included in the defect map. All defective pixels are reference to pixel 1, 1 in the defect maps. |
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