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STM32F107VB bảng dữ liệu(PDF) 76 Page - STMicroelectronics |
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STM32F107VB bảng dữ liệu(HTML) 76 Page - STMicroelectronics |
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76 / 108 page ![]() Electrical characteristics STM32F105xx, STM32F107xx 76/108 DocID15274 Rev 10 Note: ADC accuracy vs. negative injection current: Injecting a negative current on any of the standard (non-robust) analog input pins should be avoided as this significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to standard analog pins which may potentially inject negative currents. Any positive injection current within the limits specified for IINJ(PIN) and ΣIINJ(PIN) in Section 5.3.12 does not affect the ADC accuracy. Table 54. ADC accuracy - limited test conditions(1) 1. ADC DC accuracy values are measured after internal calibration. Symbol Parameter Test conditions Typ Max(2) 2. Based on characterization, not tested in production. Unit ET Total unadjusted error fPCLK2 = 56 MHz, fADC = 14 MHz, RAIN < 10 kΩ, VDDA = 3 V to 3.6 V TA = 25 °C Measurements made after ADC calibration ±1.3 ±2 LSB EO Offset error ±1 ±1.5 EG Gain error ±0.5 ±1.5 ED Differential linearity error ±0.7 ±1 EL Integral linearity error ±0.8 ±1.5 Table 55. ADC accuracy(1) (2) 1. ADC DC accuracy values are measured after internal calibration. 2. Better performance could be achieved in restricted VDD, frequency and temperature ranges. Symbol Parameter Test conditions Typ Max(3) 3. Based on characterization, not tested in production. Unit ET Total unadjusted error fPCLK2 = 56 MHz, fADC = 14 MHz, RAIN < 10 kΩ, VDDA = 2.4 V to 3.6 V Measurements made after ADC calibration ±2 ±5 LSB EO Offset error ±1.5 ±2.5 EG Gain error ±1.5 ±3 ED Differential linearity error ±1 ±2 EL Integral linearity error ±1.5 ±3 |
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