STM32L151XE datasheet(26/136 Pages) STMICROELECTRONICS

26 / 136 page

Functional overview

STM32L151xE STM32L152xE

26/136

DS10002 Rev 10

stored by ST in the system memory area, accessible in read-only mode. See Table 60:

Temperature sensor calibration values.

3.10.2

Internal voltage reference (VREFINT)

The internal voltage reference (VREFINT) provides a stable (bandgap) voltage output for the

ADC and Comparators. VREFINT is internally connected to the ADC_IN17 input channel. It

enables accurate monitoring of the VDD value (when no external voltage, VREF+, is

available for ADC). The precise voltage of VREFINT is individually measured for each part by

ST during production test and stored in the system memory area. It is accessible in read-

only mode. See Table 15: Embedded internal reference voltage calibration values.

3.11

DAC (digital-to-analog converter)

The two 12-bit buffered DAC channels can be used to convert two digital signals into two

analog voltage signal outputs. The chosen design structure is composed of integrated

resistor strings and an amplifier in non-inverting configuration.

This dual digital Interface supports the following features:

•

Two DAC converters: one for each output channel

•

8-bit or 12-bit monotonic output

•

Left or right data alignment in 12-bit mode

•

Synchronized update capability

•

Noise-wave generation

•

Triangular-wave generation

•

Dual DAC channels, independent or simultaneous conversions

•

DMA capability for each channel (including the underrun interrupt)

•

External triggers for conversion

•

Input reference voltage VREF+

Eight DAC trigger inputs are used in the STM32L151xE and STM32L152xE devices. The

DAC channels are triggered through the timer update outputs that are also connected to

different DMA channels.

3.12

Operational amplifier

The STM32L151xE and STM32L152xE devices embed two operational amplifiers with

external or internal follower routing capability (or even amplifier and filter capability with

external components). When one operational amplifier is selected, one external ADC

channel is used to enable output measurement.

The operational amplifiers feature:

•

Low input bias current

•

Low offset voltage

•

Low-power mode

•

Rail-to-rail input

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