ISO6760F datasheet(32/51 Pages) TI

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9.2.3 Application Curve

The following typical eye diagrams of the ISO676x family of devices indicates low jitter and wide open eye at the

maximum data rate of 50 Mbps.

Time = 5 ns / div

Figure 9-3. Eye Diagram at 50 Mbps PRBS 216 – 1,

5 V and 25°C

Time = 5 ns / div

Figure 9-4. Eye Diagram at 50 Mbps PRBS 216 – 1,

3.3 V and 25°C

Time = 5 ns / div

Figure 9-5. Eye Diagram at 50 Mbps PRBS 216 – 1,

2.5 V and 25°C

Time = 5 ns / div

Figure 9-6. Eye Diagram at 50 Mbps PRBS 216 – 1,

1.8 V and 25°C

9.2.3.1 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown

(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal

device and high voltage applied between the two sides; See Figure 9-7 for TDDB test setup. The insulation

breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced

insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million

(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation

voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% for

lifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20%

higher than the specified value.

Figure 9-8 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime.

Based on the TDDB data, the intrinsic capability of the insulation is 1500 VRMS with a lifetime of 220 years. Other

factors, such as package size, pollution degree, material group, etc. can further limit the working voltage of the

component. The working voltage of DW-16 package is specified upto 1500 VRMS. At the lower working voltages,

the corresponding insulation lifetime is much longer than 220 years.

ISO6760, ISO6761, ISO6762, ISO6763

SLLSFK0C – AUGUST 2021 – REVISED NOVEMBER 2021

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ISO6760F bảng dữ liệu(PDF) 32 Page - Texas Instruments