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M34E02-FDW1TP bảng dữ liệu(PDF) 17 Page - STMicroelectronics |
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M34E02-FDW1TP bảng dữ liệu(HTML) 17 Page - STMicroelectronics |
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17 / 23 page ![]() 17/23 M34E02 Table 11. DC Characteristics Note: 1. Preliminary Data. Table 12. AC Characteristics Note: 1. For a reSTART condition, or following a Write cycle. 2. Sampled only, not 100% tested. 3. To avoid spurious START and STOP conditions, a minimum delay is placed between SCL=1 and the falling or rising edge of SDA. Symbol Parameter Test Condition (in addition to those in Table 8) Min.1 Max.1 Unit ILI Input Leakage Current (SCL, SDA) VIN = VSS or VCC ± 2 µA ILO Output Leakage Current VOUT = VSS or VCC, SDA in Hi-Z ± 2 µA ICC Supply Current VCC =1.7V, fc=100kHz (rise/fall time < 30ns) 1mA ICC1 Stand-by Supply Current VIN = VSS or VCC, VCC = 3.6V 1µA VIN = VSS or VCC, VCC = 1.7V 0.5 µA VIL Input Low Voltage (SCL, SDA, WC) –0.45 0.3 VCC V VIH Input High Voltage (SCL, SDA, WC) 0.7VCC VCC+1 V VHV E0 High Voltage VHV – VCC ≥ 4.8V 710 V VOL Output Low Voltage IOL = 2.1mA, 2.2V ≤ VCC ≤ 3.6V 0.4 V IOL = 0.7mA, VCC = 1.7V 0.2 V Test conditions specified in Table 9 and 8 Symbol Alt. Parameter Min. Max. Unit fC fSCL Clock Frequency 100 kHz tCHCL tHIGH Clock Pulse Width High 4000 ns tCLCH tLOW Clock Pulse Width Low 4700 ns tDL1DL2 2 tF SDA Fall Time 20 300 ns tDXCX tSU:DAT Data In Set Up Time 250 ns tCLDX tHD:DAT Data In Hold Time 0 ns tCLQX tDH Data Out Hold Time 200 ns tCLQV 3 tAA Clock Low to Next Data Valid (Access Time) 200 3500 ns tCHDX 1 tSU:STA Start Condition Set Up Time 4700 ns tDLCL tHD:STA Start Condition Hold Time 4000 ns tCHDH tSU:STO Stop Condition Set Up Time 4000 ns tDHDL tBUF Time between Stop Condition and Next Start Condition 4700 ns tW tWR Write Time 10 ms |
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