STV7618

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Figure 2. Test configuration

8 - TESTED WAFER DISCLAIMER

All wafers are tested and guaranteed to comply with all datasheet limits up to the point of wafer sawing for

a period of ninety (90) days from the delivery date.

We remind you that it is the customer’s responsibility to test and qualify their application in which the die

is used. ST Microelectronics is ready to support the customer when qualifying the product.

V

DOUTL

I

DOUTL

Output sinking current as positive value, sourcing current as negative value