| công cụ tìm kiếm bảng dữ liệu linh kiện điện tử |
|
LM160808T bảng dữ liệu(PDF) 4 Page - Shanghai Leiditech Electronic Technology Co., Ltd |
|
|
|||||||||||||||||||||||||||||
LM160808T bảng dữ liệu(HTML) 4 Page - Shanghai Leiditech Electronic Technology Co., Ltd |
|
4 / 9 page ![]() 9 Reliability Of Ferrite Multilayer Chip Bead 1-1.Mechanical Performance No Item Specification 1-1-1 Flexure Strength The forces applied on the right Test device shall be soldered on the substrate conditions must not damage Substrate Dimension: 100x40x1.6mm the terminal electrode and the Deflection: 2.0mm ferrite Keeping Time: 30sec *For 100505, substrate dimension is 100x40x0.8mm 1-1-2 Vibration Test device shall be soldered on the substrate Oscillation Frequency: 10 to 55 to 10Hz for 1min Amplitude: 1.5mm Time: 2hrs for each axis (X, Y & Z), total 6hrs 1-1-3 Resistance to Soldering Heat Appearance: No damage Pre-heating: 150 ℃, 1min More than 75% of the terminal.Solder Composition: Sn/Ag3.0/Cu0.5(Pb-Free) electrode should be covered Solder Temperature: 260±5 ℃ with solder. Immersion Time: 10±1sec Impedance : within ±30% of initial value 1-1-4 Solder ability The electrodes shall be at Pre-heating: 150 ℃, 1min least 95% covered with new Solder Composition: Sn/Ag3.0/Cu0.5(Pb-Free) solder coating Solder Temperature: 245±5 ℃(Pb-Free) Immersion Time: 4±1sec 1-1-5 Terminal Strength Test No split termination Test device shall be soldered on the substrate, then apply a force in the direction of the arrow. Force : 5N Keeping Time: 10±1sec 1-2.Environmental Performance No Item Specification 1-2-1 Temperature Cycle Appearance: No damage One cycle: Impedance: within±30% of Step Temperature ( ℃) Time (min) initial value 1 -55±3 30 2 25±2 3 3 125±3 30 4 25±2 3 Total: 100cycles Measured after exposure in the room condition for 24hrs 1-2-2 Humidity Resistance Temperature: 40±2 ℃ Relative Humidity: 90 ~ 95% / Time: 1000hrs Measured after exposure in the room condition for 24hrs 1-2-3 High Temperature: 125±3 ℃ / Relative Humidity: 0% Temperature Resistance Applied Current: Rated Current /Time: 1000hrs Measured after exposure in the room condition for 24hrs 1-2-4 Low Temperature: -55±3 ℃ Temperature Resistance Relative Humidity: 0% / Time: 1000hrs Measured after exposure in the room condition for 24hrs Test Method Test Method Mounting Pad F Chip LM160808T Series Rev : www.leiditech.com 01.06.2018 4/9 |
|
|
Link URL |
| Cho đến nay ALLDATASHEET có giúp ích cho doanh nghiệp của bạn hay không? [ DONATE ] |
Alldatasheet là | Quảng cáo | Liên lạc với chúng tôi | Chính sách bảo mật | Liên kết đến bảng dữ liệu | Trao đổi link | Tìm kiếm theo nhà sản xuất All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |