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Giải thích chi tiết về linh kiện  MEMS digital output motion sensor: low-noise, high-bandwidth 3-axis accelerometer with TDM interface
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TDM interface characteristics
32
3
TDM interface characteristics
Please refer to Section 4: TDM interface specifications for additional details.
Table 6. TDM interface characteristics (1)
Symbol
Parameter
Test conditions
Min.
Typ.
Max.
Unit
MCLK
MCLK frequency nominal
12.288
MHz
MCLKA
MCLK frequency accuracy
-0.1
0.1
%
MCLKJ
MCLK jitter
1
ns (peak
to peak)
BCLK
BCLK frequency (1/tp)
in disabled mode
MCLK
MHz
WCLK = 8 kHz
1.024
MHz
WCLK = 16 kHz
2.048
MHz
WCLK = 24 kHz
3.072
MHz
WCLK8
8 kHz WCLK mode
8
kHz
WCLK16
16 kHz WCLK mode
16
WCLK24
24 kHz WCLK mode
24
PDC
All clock pin duty cycle
(except WCLK)
45
55
%
WT
WCLK setup time before BCLK
rising/falling edge (tss1)
20
ns
SDOST
SDOUT setup time before
BCLK rising/falling edge (tss2)
15
ns
SDOHTR
SDOUT hold time after BCLK
rising/falling edge (ths1)
15
ns
SDOHTZ
SDOUT hold time of LSB after
BCLK rising/falling edge (ths2)
15
50
ns
CMCLK
MCLK pin capacitance
10
pF
CBCLK
BCLK pin capacitance
10
CWCLK
VCLK pin capacitance
10
CSDOUT
SDOUT load capacitance
60
FRREL
Relative frequency response(2) (3)
-0.5
0.4
dB
1. All setup times and hold times in Table 6 and in Figure 4 are valid for BCLK polarity set to “clock on rising”. If BCLK polarity
is set to “clock on falling”, then all setup and hold times will refer to the falling edge of BCLK instead. Please refer to
Section 4: TDM interface specifications for additional details.
2. Data by simulation
3. All the DUT measurement points are normalized to the 294 Hz measurement. The deviation between each point and
294 Hz is calculated. The maximum deviation for points measured at frequencies below 2.0 kHz is given as FRREL.



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