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PUSB3F97 bảng dữ liệu(PDF) 8 Page - Nexperia B.V. All rights reserved

tên linh kiện PUSB3F97
Giải thích chi tiết về linh kiện  ESD protection for ultra high-speed interfaces
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PUSB3F97 bảng dữ liệu(HTML) 8 Page - Nexperia B.V. All rights reserved

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PUSB3F97
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Product data sheet
Rev. 1 —
10 May 2017
8 of 14
Nexperia
PUSB3F97
ESD protection for ultra high-speed interfaces
The device uses an advanced clamping structure showing a negative dynamic resistance.
This snap-back behavior strongly reduces the clamping voltage to the system behind the
ESD protection during an ESD event. Do not connect unlimited DC current sources to the
data lines to avoid keeping the ESD protection device in snap-back state after exceeding
breakdown voltage (due to an ESD pulse for instance).
IEC 61000-4-5; tp =8/20 s; positive pulse
IEC 61000-4-5; tp =8/20 s; negative pulse
Fig 11. Dynamic resistance with positive clamping;
typical values
Fig 12. Dynamic resistance with negative clamping;
typical values
tp = 100 ns; Transmission Line Pulse (TLP)
tp = 100 ns; Transmission Line Pulse (TLP)
Fig 13. Dynamic resistance with positive clamping;
typical values
Fig 14. Dynamic resistance with negative clamping;
typical values



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