AM93LC86

16384-bits Serial Electrically Erasable PROM

(Preliminary)

Anachip Corp.

www.anachip.com.tw

Rev 0.1 Oct 20, 2003

3/12

Symbol

Parameter

Conditions

Min

Max

Unit

I

CC

Operating current**

3

mA

I

SB

Standby current

CS=DI=SK=0V

10

µA

I

IL

Input leakage

-1

1

µA

I

OL

Output leakage

-1

1

µA

-0.1

V

IL

Input low voltage**

-0.1

0.8

V

V

IH

Input high voltage**

2

V

V

OL1

Output low voltage

0.4

V

V

OH1

Output high voltage

2.4

V

V

OL2

Output low voltage

0.2

V

V

OL2

Output high voltage

V

Symbol

Parameter

Conditions

Min

Max

Unit

SK Clock Frequency

0

1

Mhz

SK High Time

250

nS

SK Low Time

250

nS

Minimum CS Low Time

250

nS

CS Setup Time

Relative to SK

50

nS

DI Setup Time

Relative to SK

100

nS

CS Hold Time

Relative to SK

0

nS

DI Hold Time

Relative to SK

100

nS

Output Delay to "1"

AC test (Fig. 1)

500

nS

Output Delay to "0"

AC test (Fig. 1)

500

nS

CS to Status Valid

AC test CL = 100pF

500

nS

CS to DO in 3-state

CS = VIL

100

nS

Write Cycle Time

10

mS

5V, 25ºC

1M

write cycles

Note: The parameter is characterized and isn’t 100% tested.

632 ohm

DO

1.247V

(1 TTL Gate Load)

100PF

Figure 1. AC test circuit