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SSM3K35CT bảng dữ liệu(PDF) 2 Page - Toshiba Semiconductor

tên linh kiện SSM3K35CT
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SSM3K35CT
2014-03-01
2
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
Min
Typ.
Max
Unit
Gate leakage current
IGSS
VGS = ±10 V, VDS = 0V
⎯
⎯
±10
μA
Drain–source breakdown voltage
V (BR) DSS
ID = 0.1 mA, VGS = 0V
20
⎯
⎯
V
Drain cutoff current
IDSS
VDS = 20 V, VGS = 0V
⎯
⎯
1
μA
Gate threshold voltage
Vth
VDS = 3 V, ID = 1 mA
0.4
⎯
1.0
V
Forward transfer admittance
⏐Yfs⏐
VDS = 3 V, ID = 50 mA
(Note 2)
115
⎯
⎯
mS
ID = 50 mA, VGS = 4 V
(Note 2)
⎯
1.5
3
ID = 50 mA, VGS = 2.5 V
(Note 2)
⎯
2
4
ID = 5 mA, VGS = 1.5 V
(Note 2)
⎯
3
8
Drain–source ON-resistance
RDS (ON)
ID = 5 mA, VGS = 1.2 V
(Note 2)
⎯
5
20
Ω
Input capacitance
Ciss
⎯
9.5
⎯
Reverse transfer capacitance
Crss
⎯
4.1
⎯
Output capacitance
Coss
VDS = 3 V, VGS = 0V, f = 1 MHz
⎯
9.5
⎯
pF
Turn-on time
ton
⎯
115
⎯
Switching time
Turn-off time
toff
VDD = 3 V, ID = 50 mA,
VGS = 0 to 2.5 V
⎯
300
⎯
ns
Drain–source forward voltage
VDSF
ID = - 180 mA, VGS = 0V
(Note 2)
⎯
-0.9
-1.2
V
Note 2: Pulse test
Switching Time Test Circuit
(a) Test Circuit
(b) VIN
Usage Considerations
Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (1 mA for the
SSM3K35CT). Then, for normal switching operation, VGS(on) must be higher than Vth, and VGS(off) must be lower than
Vth. This relationship can be expressed as: VGS(off) < Vth < VGS(on).
Take this into consideration when using the device.
Handling Precaution
When handling individual devices (which are not yet mounting on a circuit board), be sure that the environment is
protected against electrostatic electricity. Operators should wear anti-static clothing, and containers and other objects
that come into direct contact with devices should be made of anti-static materials.
VDD = 3 V
Duty
≤ 1%
VIN: tr, tf < 5 ns
(Zout = 50 Ω)
Common Source
Ta
= 25°C
VDD
OUT
IN
2.5 V
0
10
μs
RL
(c) VOUT
ton
90%
10%
0 V
2.5 V
10%
90%
toff
tr
tf
VDD
VDS (ON)



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