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LPV511MG bảng dữ liệu(PDF) 5 Page - National Semiconductor (TI) |
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LPV511MG bảng dữ liệu(HTML) 5 Page - National Semiconductor (TI) |
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5 / 14 page ![]() 12V Electrical Characteristics (Note 5) (Continued) Unless otherwise specified, all limits are guaranteed for T J = 25˚C, V + = 12V, V− = 0V, V CM =VO =V +/2, and R L = 100 k Ω to V +/2. Boldface limits apply to the temperature range of −40˚C to 85˚C. Symbol Parameter Conditions Min (Note 6) Typ (Note 7) Max (Note 6) Units SR Slew Rate (Note 11) A V = +1, VO ramped from 1V to 11V 5.25 3.10 7.0 V/ms GBW Gain Bandwidth Product R L =1M Ω,C L=50pF 25 kHz Phase Margin R L =1M Ω,C L=50pF 52 deg e n Input-Referred Voltage Noise f = 100 Hz 320 nV/ i n Input-Referred Current Noise f = 10 Hz .02 pA/ f = 1 kHz .01 Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics Tables. Note 2: Human Body Model: 1.5 k Ω in series with 100 pF. Machine Model: 0Ω in series with 200 pF. Note 3: The maximum power dissipation is a function of TJ(MAX), θJA, and TA. The maximum allowable power dissipation at any ambient temperature is PD =(TJ(MAX) -TA)/ θJA . All numbers apply for packages soldered directly onto a PC board. Note 4: Output short circuit duration is infinite for V+ < 6V at room temperature and below. For V+ > 6V, allowable short circuit duration is 1.5 ms. Note 5: Electrical table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device. Note 6: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlations using the Statistical Quality Control (SQC) method. Note 7: Typical values represent the most likely parametric norm at the time of characterization. Note 8: Offset voltage average drift is determined by dividing the change in VOS at temperature extremes into the total temperature change. Note 9: Positive current corresponds to current flowing into the device. Note 10: The Short Circuit Test is a momentary test. See (Note 4). Note 11: Slew rate is the average of the rising and falling slew rates. www.national.com 5 |
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