TLE4998P8(D)

Maximum Ratings

Data Sheet

8

Revision 1.1, 2017-01

3

Maximum Ratings

All further given specifications are regarded to each of the implemented sensors IC’s, or otherwise noted.

Attention: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent

damage to the device. This is a stress rating only and functional operation of the device at these

or any other conditions above those indicated in the operational sections of this specification

is not implied. Furthermore, only single error cases are assumed. More than one stress/error

case may also damage the device.

Exposure to absolute maximum rating conditions for extended periods may affect device

reliability. During absolute maximum rating overload conditions the voltage on VDD pins with

respect to ground (VSS) must not exceed the values defined by the absolute maximum ratings.

Lifetime statements are an anticipation based on an extrapolation of Infineon’s qualification

test results. The actual lifetime of a component depends on its form of application and type of

use etc. and may deviate from such statement. The lifetime statement shall in no event extend

the agreed warranty period.

Table 3-1

Absolute Maximum Ratings

Parameter

Symbol

Values

Unit

Note / Test Condition

Min.

Typ.

Max.

Junction temperature

- 40

–

1) For limited time of 96 h. Depends on customer temperature lifetime cycle. Please ask Infineon for support.

°C

–

Voltage on

V

ground

-18

–

18.35

V

2)3)

2) Higher voltage stress than absolute maximum rating, e.g. 150% in latch-up tests is not applicable. In such cases,

R

series

≥100 Ω for current limitation is required.

3) Max 1h, in operating temperature range.

Supply current @ overvoltage

V

––15

mA

–

Reverse supply current @

V

-1

–

0

mA

–

Voltage on output pin with respect to

ground

4)

I

–

5)

V

V–

Magnetic field

-–

1

T

–

ESD protection

–

–

±2

kV

According HBM

ANSI/ESDA/JEDEC

JS-001