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TLE4983C-HTNE6747 bảng dữ liệu(PDF) 21 Page - Infineon Technologies AG |
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TLE4983C-HTNE6747 bảng dữ liệu(HTML) 21 Page - Infineon Technologies AG |
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21 / 29 page ![]() Page 21 of 29 Electro Magnetic Compatibility - (values depend on RSeries) Additional Information: Characterisation of Electro Magnetic Compatibility are carried out on sample base of one qualification lot. Not all specification parameters have been monitored during EMC exposure. Only key parameters e.g. switching current and duty cycle have been monitored. Ref. ISO 7637-1; see test circuit of figure 8; ∆BPP = 10mT (ideal sinusoidal signal); VS=13.5V ± 0.5V, fB= 1000Hz; T= 25°C; RSeries ≥ 200Ω; Parameter Symbol Level/typ Status Testpulse 1 Testpulse 2 Testpulse 3a Testpulse 3b Testpulse 4 VEMC IV / -100V IV / 100V IV / -150V IV / 100V IV / -7V C A 13 A A A Ref. ISO 7637-2; 2 nd edition 06/2004 see test circuit of figure 8; ∆BPP = 2mT (amplitude sinus signal); VS=13.5V ± 0.5V, fB= 1000Hz; T= 25°C; RSeries ≥ 200Ω; Parameter Symbol Level/typ Status Testpulse 2a Testpulse 5a Testpulse 5b VEMC IV / 40V IV / 86.5V IV / 86.5V A C A 14 Note: Test criteria for status A: No missing pulse no additional pulse on the IC output signal plus duty cycle and jitter are in the specification limits. Test criteria for status B: No missing pulse no additional pulse on the IC output signal. (Output signal “OFF” means switching to the voltage of the pull-up resistor). Test criteria for status C: One or more parameter can be out of specification during the exposure but returns automatically to normal operation after exposure is removed. Test criteria for status E: destroyed. 13 Valid during Vs is applied afterwards Status C, current consumption may be out of spec during testpulse 14 Suppressed Us*=35V |
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