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TSM2N100CP bảng dữ liệu(PDF) 2 Page - Taiwan Semiconductor Company, Ltd |
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TSM2N100CP bảng dữ liệu(HTML) 2 Page - Taiwan Semiconductor Company, Ltd |
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2 / 6 page ![]() TSM2N100CP Taiwan Semiconductor 2 Version: A1606 ELECTRICAL SPECIFICATIONS (T A = 25°C unless otherwise noted) PARAMETER CONDITIONS SYMBOL MIN TYP MAX UNIT Static Drain-Source Breakdown Voltage VGS = 0V, ID = 250µA BVDSS 1000 -- -- V Gate Threshold Voltage VDS = VGS, ID = 250µA VGS(TH) 3.5 4.5 5.5 V Gate Body Leakage VGS = ±30V, VDS = 0V IGSS -- -- ±100 nA Zero Gate Voltage Drain Current VDS = 1000V, VGS = 0V IDSS -- -- 1 µA Drain-Source On-State Resistance (Note 4) VGS = 10V, ID = 0.9A RDS(on) -- 6 8.5 Ω Dynamic (Note 5) Total Gate Charge VDS = 800V, ID = 1.85A, VGS = 10V Qg -- 17 -- nC Gate-Source Charge Qgs -- 5 -- Gate-Drain Charge Qgd -- 9 -- Input Capacitance VDS = 25V, VGS = 0V, f = 1.0MHz Ciss -- 625 -- pF Output Capacitance Coss -- 38 -- Reverse Transfer Capacitance Crss 15 Gate Resistance f = 1.0MHz, open drain Rg -- 2.2 -- Ω Switching (Note 6) Turn-On Delay Time VDD = 500V, RG = 25Ω, ID = 0.9A, VGS = 10V td(on) -- 31 -- ns Turn-On Rise Time tr -- 14 -- Turn-Off Delay Time td(off) -- 78 -- Turn-Off Fall Time tf -- 44 -- Source-Drain Diode Forward Voltage (Note 4) IS = 1.85A, VGS = 0V VSD -- -- 1.4 V Reverse Recovery Time VR = 100V, IS = 1.85A dIF/dt = 100A/μs trr -- 359 -- ns Reverse Recovery Charge Qrr -- 1.34 -- μC Notes: 1. Current limited by package 2. Pulse width limited by the maximum junction temperature 3. L = 20mH, IAS = 1.4A, VDD = 50V, RG = 25Ω, Starting TJ = 25 oC 4. Pulse test: PW ≤ 300µs, duty cycle ≤ 2% 5. For DESIGN AID ONLY, not subject to production testing. 6. Switching time is essentially independent of operating temperature. ORDERING INFORMATION PART NO. PACKAGE PACKING TSM2N100CP ROG TO-252 (DPAK) 2,500pcs / 13” Reel |
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