| nhà sản xuất | tên linh kiện | bảng dữ liệu | Giải thích chi tiết về linh kiện |
 National Semiconductor ... |
AD-03
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43Kb / 4P |
Effects of Aperture Time and Jitter in a Sampled Data System
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 NEC |
2SD1513
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149Kb / 2P |
Driver and output stages of audio frequency amplifiers
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 JL World Company Limite... |
HBC0603A-65
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259Kb / 1P |
Frequency Response
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HMC0603A-65
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397Kb / 1P |
Frequency Response
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HBO0603G-65
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408Kb / 1P |
Frequency Response
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HBO0603G-65
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408Kb / 1P |
Frequency Response
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 M/A-COM Technology Solu... |
S2080
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45Kb / 2P |
Moisture Effects on the Soldering of Plastic Encapsulated Devices
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 Analog Devices |
AN-756
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298Kb / 12P |
Sampled Systems and the Effects of Clock Phase Noise and Jitter
REV. 0 |
 STMicroelectronics |
AN2352
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188Kb / 20P |
PLL jitter effects on C-CAN modules of the ST10F27x
24-Sep-2013 |
 Dynex Semiconductor |
AN4870
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81Kb / 5P |
Effects Of Temperature On Thyristor Performance
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