 Features
 AEC-Q100 qualified
− Device ambient temperature:
-40°C ≤ TA ≤ 125°C
− Device junction temperature:
-40°C ≤ TJ ≤ 150°C
 4.5 V to 35 V (40 V abs. max) operating range
 Maximum output current : 12 A
 RDS(ON): 84 mΩ (typ) per half bridge
 Supports 3.3 V, 5 V logic inputs
 PWM operation up to 25 kHz
 Very low sleep current, 5.8 μA (max) at 125°C
 Optimized EMI performance
− Spread spectrum clocking (SPI only)
− Configurable slew rate
 Integrated shunt-less current sense
 Configurable current regulation
 Complete protection and diagnostic with
configurable fault reaction (latched or retry)
− Overcurrent protection
− Overtemperature protection
− Off-state short & open diagnostics
− On-state short & open diagnostics (SPI
only)
− VM overvoltage detection
− VM undervoltage detection
− Configurable dead time
 Configurable as H-Bridge or two independent
half bridges
− Single H-Bridge using PWM or PH/EN
mode
− Two half-bridges using Independent mode
 Supports both SPI and HW options
 Applications
 Automotive brushed DC motors and solenoids
 Zone control unit (ZCU)
 Hidden door handles
 Side mirror modules
 Electric spoiler adjustment
 Door lock, child lock, tail gate lock
 E-Shifter
 Description
The DIA58243 is a full bridge motor driver intended
for a wide range of automotive applications. The
H-bridge consists of four N-channel power
MOSFETs and a charge pump regulator which
improves efficiency by supporting N-channel
MOSFETs with 100% duty cycle driving.
An internal current mirror architecture on the IPROPI
pin implements current sensing and regulation. This
eliminates the need for a low-ohm shunt resistor,
saving board area and reducing system cost.
The DIA58243 integrates complete diagnostics and
protections, including the monitoring of the supply
voltage, overtemperature shutdown, overcurrent
protection and load diagnostics in both the off-state
and on-state to detect open load, and short circuit.
Fault conditions are indicated on the nFAULT pin.
The SPI interface allows more flexible device
configuration and fault observability.