Features
•Digital compensation of sensor offset, sensitivity,temperature drift, and nonlinearity
•Programmable analog gain and digital gain;accommodates bridges with spans < 1mV/V and high offset
•Many diagnostic features on chip (e.g., EEPROMsignature, bridge connection checks, bridge shortdetection, power loss detection)
•Independently programmable high and lowclipping levels
•24-bit customer ID field for module traceability
•Internal temperature compensation reference (noexternal components)
•Option for external temperature compensationwith addition of single diode
•Output options: rail-to-rail ratiometric analogvoltage (12-bit resolution), absolute analogvoltage, ZACwire™ digital one-wire interface
•Fast power-up to data out response; outputavailable 5ms after power-up
•Current consumption depends on programmedsample rate and mode: 1mA down to 300μA (typ.)
•Fast response time: 1.4ms typical
•High voltage protection: ≤ 30V with external JFET
•AEC-Q100 qualified