SN54AHCT574, SN74AHCT574

OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS

WITH 3-STATE OUTPUTS

SCLS245L – OCTOBER 1995 – REVISED JULY 2003

3

POST OFFICE BOX 655303

recommended operating conditions (see Note 3)

SN54AHCT574

SN74AHCT574

UNIT

MIN

MAX

MIN

MAX

UNIT

VCC

Supply voltage

4.5

5.5

4.5

5.5

V

VIH

High-level input voltage

2

2

V

VIL

Low-level input voltage

0.8

0.8

V

VI

Input voltage

0

5.5

0

5.5

V

VO

Output voltage

0

VCC

0

VCC

V

IOH

High-level output current

–8

–8

mA

IOL

Low-level output current

8

8

mA

∆t/∆v

Input transition rise or fall rate

20

20

ns/V

TA

Operating free-air temperature

–55

125

–40

85

°C

NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,

Implications of Slow or Floating CMOS Inputs, literature number SCBA004.

electrical characteristics over recommended operating free-air temperature range (unless

otherwise noted)

PARAMETER

TEST CONDITIONS

VCC

TA = 25°C

SN54AHCT574

SN74AHCT574

UNIT

PARAMETER

TEST CONDITIONS

VCC

MIN

TYP

MAX

MIN

MAX

MIN

MAX

UNIT

VOH

IOH = –50 mA

45 V

4.4

4.5

4.4

4.4

V

VOH

IOH = –8 mA

4.5 V

3.94

3.8

3.8

V

VOL

IOL = 50 mA

45 V

0.1

0.1

0.1

V

VOL

IOL = 8 mA

4.5 V

0.36

0.44

0.44

V

II

VI = 5.5 V or GND

0 V to 5.5 V

±0.1

±1*

±1

mA

IOZ

VO = VCC or GND

5.5 V

±0.25

±2.5

±2.5

mA

ICC

VI = VCC or GND,

IO = 0

5.5 V

4

40

40

mA

∆ICC†

One input at 3.4 V,

Other inputs at VCC or GND

5.5 V

1.35

1.5

1.5

mA

Ci

VI = VCC or GND

5 V

3

10

10

pF

Co

VO = VCC or GND

5 V

3

pF

* On products compliant to MIL-PRF-38535, this parameter is not production tested at VCC = 0 V.

† This is the increase in supply current for each input at one of the specified TTL voltage levels, rather than 0 V or VCC.

(unless otherwise noted) (see Figure 1)

TA = 25°C

SN54AHCT574

SN74AHCT574

UNIT

MIN

MAX

MIN

MAX

MIN

MAX

UNIT

tw

Pulse duration, CLK high or low

5

5.5

5.5

ns

tsu

Setup time, data before CLK

↑

3

3.5

3.5

ns

th

Hold time, data after CLK

↑

1.5

1.5

1.5

ns