STM32F446RC datasheet(132/201 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32F446xC/E

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DocID027107 Rev 5

QSPI interface characteristics

Unless otherwise specified, the parameters given in Table 64 for QSPI are derived from

tests performed under the ambient temperature, fAHB frequency and VDD supply voltage

conditions summarized in Table 16, with the following configuration:

•

Output speed is set to OSPEEDRy[1:0] = 11

•

Capacitive load C=20pF

•

Measurement points are done at CMOS levels: 0.5VDD

Refer to Section 6.3.17: I/O port characteristics for more details on the input/output alternate

function characteristics.

Table 64. QSPI dynamic characteristics in SDR Mode(1)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

fSCK

1/tc(SCK)

QSPI clock frequency

Write mode

1.71 V≤VDD≤3.6 V

Cload = 15 pF

MHz

Read mode

2.7V <VDD< 3.6V

Cload = 15 pF

1.71 V≤VDD≤3.6 V

tw(CKH)

QSPI clock high and low

(T(CK) / 2) - 2

T(CK) / 2

tw(CKL)

T(CK) / 2

(T(CK) / 2) +2

ts(IN)

Data input setup time

th(IN)

Data input hold time

4.5

tv(OUT)

Data output valid time

1.5

th(OUT)

Data output hold time

1. Guaranteed based on test during characterization.

Table 65. QSPI dynamic characteristics in DDR Mode(1)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

fSCK

1/tc(SCK)

QSPI clock frequency

Write mode

1.71 V≤VDD≤3.6 V

Cload = 15 pF

MHz

Read mode

2.7V <VDD< 3.6V

Cload = 15 pF

1.71 V≤VDD≤3.6 V

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