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STM32F215RG bảng dữ liệu(PDF) 121 Page - STMicroelectronics

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STM32F215RG bảng dữ liệu(HTML) 121 Page - STMicroelectronics

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STM32F21xxx
Electrical characteristics
Doc ID 17050 Rev 8
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Figure 52.
12-bit buffered /non-buffered DAC
1.
The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly
without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the
DAC_CR register.
5.3.22
Temperature sensor characteristics
5.3.23
VBAT monitoring characteristics
R LOAD
C LOAD
Buffered/Non-buffered DAC
DACx_OUT
Buffer(1)
12-bit
digital to
analog
converter
ai17157
Table 66.
TS characteristics
Symbol
Parameter
Min
Typ
Max
Unit
TL
(1)
1.
Based on characterization, not tested in production.
VSENSE linearity with temperature
-
±1
±2°C
Avg_Slope(1)
Average slope
-
2.5
mV/°C
V25
(1)
Voltage at 25 °C
-
0.76
V
tSTART
(2)
2.
Guaranteed by design, not tested in production.
Startup time
-
6
10
µs
TS_temp
(3)(2)
3.
Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the
temperature
1°C accuracy
10
-
-
µs
Table 67.
VBAT monitoring characteristics
Symbol
Parameter
Min
Typ
Max
Unit
R
Resistor bridge for VBAT
-50-
K
Ω
Q
Ratio on VBAT measurement
-
2
-
Er(1)
1.
Guaranteed by design, not tested in production.
Error on Q
–1
-
+1
%
TS_vbat
(2)(2)
2.
Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the VBAT
1mV accuracy
5-
-
µs



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