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STM32F215RG bảng dữ liệu(PDF) 120 Page - STMicroelectronics

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STM32F215RG bảng dữ liệu(HTML) 120 Page - STMicroelectronics

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Electrical characteristics
STM32F21xxx
120/173
Doc ID 17050 Rev 8
INL(3)
Integral non linearity
(difference between
measured value at Code i
and the value at Code i on a
line drawn between Code 0
and last Code 1023)
--
±1
LSB
Given for the DAC in 10-bit
configuration.
--
±4
LSB
Given for the DAC in 12-bit
configuration.
Offset(3)
Offset error
(difference between
measured value at Code
(0x800) and the ideal value =
VREF+/2)
--
±10
mV
Given for the DAC in 12-bit
configuration
--
±3
LSB
Given for the DAC in 10-bit at
VREF+ = 3.6 V
--
±12
LSB
Given for the DAC in 12-bit at
VREF+ = 3.6 V
Gain
error(3)
Gain error
-
-
±0.5
%
Given for the DAC in 12-bit
configuration
tSETTLING
(3)
Settling time (full scale: for a
10-bit input code transition
between the lowest and the
highest input codes when
DAC_OUT reaches final
value ±4LSB
-3
6
µs
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
THD(3)
Total Harmonic Distortion
Buffer ON
--
-
dB
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
Update
rate(1)
Max frequency for a correct
DAC_OUT change when
small variation in the input
code (from code i to i+1LSB)
--
1
MS/s
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
tWAKEUP
(3)
Wakeup time from off state
(Setting the ENx bit in the
DAC Control register)
-6.5
10
µs
CLOAD ≤ 50 pF, RLOAD ≥ 5 kΩ
input code between lowest and
highest possible ones.
PSRR+ (1)
Power supply rejection ratio
(to VDDA) (static DC
measurement)
-
–67
–40
dB
No RLOAD, CLOAD = 50 pF
1.
Guaranteed by design, not tested in production.
2.
The quiescent mode corresponds to a state where the DAC maintains a stable output level to ensure that no dynamic
consumption occurs.
3.
Guaranteed by characterization, not tested in production.
Table 65.
DAC characteristics (continued)
Symbol
Parameter
Min
Typ
Max
Unit
Comments



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